集成电路测试的目的是希望在一批器件中找出有缺陷的器件，从而将交付的DPPM(每百万器件中的缺陷器件数目)降低至100以下。通过对自动测试图样生成(ATPG)算法进行一些设计修改，就可能在合理的测试图样数目下达到较高的缺陷覆盖率。本文描述了在评估不同 ...

故障建模是生产测试的基础，在介绍故障建模前需要先理清集成电路中几个容易混淆的概念：缺陷、故障、误差和漏洞。 缺陷是指在集成电路制造过程中，在硅片上所产生的物理异常，如某些器件多余或被遗漏了。故障是指由于缺陷所表现出的不同于正常功能的 ...

VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.