Electronic Design

Circuit Card Diagnostic and Test System Offers Component-Level Diagnostics

Astronics released its next-generation circuit card diagnostic and test system, the PinPoint 3-PXIe (P3-PXIe). Combining more than 30 years of development of the PinPoint Circuit Card diagnostic ...
pv magazine International

Components level testing vs PV panel testing

Currently, the PV Evolution Labs (PVEL) Backsheet Durability Sequence (BDS) is considered to be the gold standard for evaluating long-term reliability of PV backsheets via several testing protocols ...
Semiconductor Engineering

Mission-Critical Devices Drive System-Level Test Expansion

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...
Electronic Design

Optical Sensors: Apply Reliability Strategies to Drive Smart Component Selection

What are the key factors in optimizing mean time between failure (MTBF)? Developing the best strategy for MTBF. What to look for in MTBF test studies. For designers of engineered electronics powering ...