Within a modest engineering laboratory at Duke University, a new type of researcher is quietly at work next to an optical microscope. This new researcher has no need for coffee, does not become tired, ...

Abstract: A next generation system and methodology for high-throughput e-beam hot spot inspection is described. Rather than capturing images of each hot spot, just a single pixel centered on the ...

Abstract: Scanning acoustic microscope (SAM) inspection is becoming an essential nondestructive procedure to defect delamination, voids, cracks in the plastic encapsulated devices. The C-scan SAM ...

A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

Abstract: The goal of this study is to construct a defect inspection microscope system for EUV multilayer mask, the beamline19A2 of National Synchrotron Radiation Research Center in Hsinchu was ...

Magnification has been an integrated and crucial part of PCB production and rework for many years, and digital microscopes have taken PCB inspection to the next level. What many electronics ...